optical analysis of Co-doped SnO2 nanostructured thin films by using spectroscopic ellipsometry technique

توضیحات

 optical analysis of Co-doped SnO2 nanostructured thin films by using spectroscopic ellipsometry technique دارای 6 صفحه می باشد و دارای تنظیمات در microsoft word می باشد و آماده پرینت یا چاپ است

فایل ورد optical analysis of Co-doped SnO2 nanostructured thin films by using spectroscopic ellipsometry technique  کاملا فرمت بندی و تنظیم شده در استاندارد دانشگاه  و مراکز دولتی می باشد.

توجه : در صورت  مشاهده  بهم ریختگی احتمالی در متون زیر ،دلیل ان کپی کردن این مطالب از داخل فایل ورد می باشد و در فایل اصلی optical analysis of Co-doped SnO2 nanostructured thin films by using spectroscopic ellipsometry technique،به هیچ وجه بهم ریختگی وجود ندارد

بخشی از متن optical analysis of Co-doped SnO2 nanostructured thin films by using spectroscopic ellipsometry technique :

چکیده مقاله:

Optical properties of sol-gel spin coated Co-doped SnO2 thin film deposited on the glass substrate was investigated by using spectroscopic ellipsometry (SE) technique. SE measurements are done at three various incidence angles of light including 67.5°, 70° and 72.5°. Influeces of the incidence angle of light emitted by SE device on optical constants including the reflectance, refractive index, extinction and absorption coefficents were studied. By absorption coefficient values obtained from SE measurements and using Tauc equation, we determined the band gap energy values. Results showed the increase of incidence angle of light from 67.5° to 72.5° leads to decrease of the bandgap energy from 3.5 to 3.4 ev.

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